TEST & MEASUREMENT
USB picoammeter takes measurements
from 1pA to 2.499mA
Available from Saelig, RBD Instruments’ 9103 USB graphing
picoammeter is a compact, versatile, general-purpose picoammeter
designed to
accurately measure DC
current from nanoamps
to milliamps via its
isolated BNC input.
This rugged, portable,
and affordable picocurrent
sensor is available
with high-speed and high-voltage options, optional bias, and
5kVDC float isolation. The 9103 USB Picoammeter measures
bi-polar DC current and can be biased from an optional built-in
fixed +90VDC bias, or an external low-noise DC power supply.
It comes with a NIST-traceable calibration certificate. The 9103
can take accurate current measurements from 1pA to 2.499mA
at sample rates up to 500Sa/s. The user-friendly PC software
interface supplied provides optimal control and quick access
to all functions such as data recording and graphing. The 9103
is also compatible with OSx, Linux, Matlab, and LabView, and
can be controlled via a simple ASCII interface. Designed to
provide precise bipolar DC current measurements even in noisy
environments such as synchrotron beam lines, the 9103 is
equally suited for diode and IC I/V characterization. The 9103
is also multi-channel capable - up to 127 units can be synchronized
together.
Saelig
www.saelig.com
MT8870A upgrades cut LTE test time
and investment
Anritsu Corporation has announced two new software options
for its Universal Wireless Test Set MT8870A to measure
RF characteristics of
3GPP-compliant LTEV2X
(PC5) devices.
The new software
options are LTE-V2X
Tx Measurement
MX887068A and
LTE-V2X Waveforms
MV887068A and
are said to offer the industry’s fastest, fully automatic, nonsignaling
based LTE-V2X TRx tests. Customers already using
the MT8870A can extend its functionality simply by installing
the software, with no need to invest in new equipment. With
four TRX measurement modules installed in the MT8870A, four
DUTs (devices under test) can be connected and measured simultaneously.
Different wireless systems can also be measured
in parallel, cutting measurement time and the space taken up
by test equipment. The new software expands the capabilities
of the Universal Wireless Test Set MT8870A, which is designed
for mass-production test of multi-standard wireless systems. In
addition to LTE-V2X and IEEE 802.11p(DSRC) for automotive
solutions, the test set also supports the latest 5G sub-6 GHz,
LTE, NB-IoT, Cat-M, WLAN and Bluetooth standards.
Anritsu Corporation
www.anritsu.com
AWGs deliver 24V output swings
on up to 8 channels
The ability of Arbitrary Waveform Generators (AWGs) to recreate
virtually any waveshape makes them especially useful as
signal generators in
today’s sophisticated
electronic systems.
Spectrum Instrumentation
recently released
four new models in its
generatorNETBOX family
with output swings
of up to 24 volts on up to 8 channels, to cover even the most
demanding test applications. The Arbitrary Waveform Generators
use the latest 16-bit Digital-Analog-Converters and offer
two different speed ranges: the DN2.657 models output waveforms
at rates up to 125 MS/s while the DN2.654 units have
a 40 MS/s capability. Both speed ranges are available with
either 4 or 8 fully synchronous channels. Small and compact,
Spectrum’s generatorNETBOX products use Gbit Ethernet and
weigh as little as 6.3 Kgs. This means they are portable and
can work almost anywhere. For applications where a generatorNETBOX
needs to operate remotely, Spectrum also offers an
embedded server option, DN2.xxx-Emb. The option combines
a powerful CPU, a freely accessible SSD, more memory and
a remote software development access method. It creates
an open platform where the user can run their own software
while, at the same time, still be connected, via LAN, for remote
access. All the models feature the ability to output waveforms
with amplitude swings of up to ±12V into a 1 MOhm load or
±6V into 50 Ohms.
Spectrum Instrumentation
www.spectrum-instrumentation.com
HIL tests for AURIX-based systems
save time and cost
Hitex now offers extensive support for Hardware-in-the-Loop
(HIL) testing of AURIX based systems. HIL tests allow testing
of embedded
real-time control
systems in a virtual
environment,
significantly reducing
costs and test
times. Complete
HIL systems can
be complex and
expensive, but the miniHIL was developed in cooperation with
Protos Software GmbH as a cost-effective system for automated
tests. The unit under test is connected to miniHIL, for
which a variety of adapters for different microcontrollers are
available. Of course, proprietary hardware can also be connected
via customized adapters. A HIL system has to emulate
sensors and actuators in order to connect the test system to
the environment. This procedure allows embedded systems to
be secured at an early stage, which significantly reduces the
costs for troubleshooting. For example, failure conditions can
be documented and repeated more easily.
Hitex
www.hitex.de
www.eenewseurope.com eeNews Europe March 2020 News 37
/
/www.saelig.com
/www.anritsu.com
/www.spectrum-instrumentation.com
/www.hitex.de
/www.eenewseurope.com